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Semiconductor

What is Semiconductor Reliability Testing?

Semiconductor reliability testing is a series of processes to evaluate how long and how stably semiconductor devices can operate in real-world environments. By applying various stress conditions such as high/low temperature, humidity, and voltage, it predicts device durability and lifespan and is essential for product quality assurance.

Test Items

  • Electrostatic Discharge (ESD) Testing

    • Purpose : Testing Evaluates whether the device can operate stably and is not damaged by electrostatic discharge
    • Test Items : HBM, MM, CDM, Latch-up (I-mode), Latch-up (VDD-VSS)

  • Environmental Durability Testing

    • Purpose : Evaluates stable operation under various environmental conditions
    • Test Items : HTOL (High Temperature Operation Life), LTOL (Low Temperature Operation Life), TC (Temperature Cycle), uHAST (Unbiased Highly Accelerated Stress Test)

  • Failure Analysis

    • Purpose : Identifies causes of performance defects and analyzes failure factors to improve product quality
    • Test Items : Delamination, Decap, SEM/EDS, X-RAY, Cross section

Key Standards

JESD22-A104, JESD22-A108, JESD22-A101, JESD22-A115, JESD78E, JEDEC JS-002, AEC-Q100