Reliability Test

• Purpose : This test simulates various environmental conditions of a vehicle to evaluate the durability of the battery against vibration, shock, temperature, and humidity.
• Test Items : Drop, vibration, shock, thermal shock, temperature and humidity, altitude, corrosion, waterproof and dustproof, etc.

Fire Safety Test

• Purpose : This test evaluates the battery's safety in extreme conditions such as impact and overheating to minimize the possibility of fire.
• Test Items : Crushing, penetration, overcharging, overdischarge, short circuit, heat exposure, combustion tests, etc.

Lifetime Durability Test

• Purpose : This test simulates real vehicle operating conditions by subjecting the battery to repeated charging and discharging cycles to measure the rate of performance degradation, predict battery lifespan, and improve the battery management system.
• Test Items : Charge/discharge cycle durability test, lifetime prediction test, etc.

Durability Test

• Purpose : This test evaluates whether the electric vehicle’s motor, inverter, and reduction gear, which make up the drive system, can operate stably in long-term usage conditions.
• Test Items : High-temperature operation durability, low-temperature operation durability, temperature cycle durability, temperature and humidity cycle durability, high temperature and humidity durability, torque ripple, shaft voltage, efficiency, etc.

Environmental Test

• Purpose : This test evaluates whether the drive motor can operate stably after exposure to extreme mechanical and environmental conditions.
• Test Items : Vibration, shock, temperature and humidity, combined corrosion, waterproof and dustproof, etc.

Electrostatic Discharge (ESD) Test

• Purpose : This test assesses the potential for damage caused by electrostatic discharge (ESD) and verifies if the semiconductor device can operate stably.
• Test Items : HBM (Human Body Model), MM (Machine Model), CDM (Charged Device Model), Latch-up (I-Mode), Latch-up (VDD-VSS), etc.

Environmental Durability Test

• Purpose : This test checks whether the semiconductor device operates stably under various environmental conditions.
• Test Items : HTOL (High Temperature Operating Life), LTOL (Low Temperature Operating Life), TC (Temperature Cycle), uHAST (Unbiased Highly Accelerated Stress Test), etc.

Failure Analysis

• Purpose : This test analyzes the causes of performance defects in the product to identify and improve failure factors.
• Test Items : Delamination, Decap, SEM/EDS (Scanning Electron Microscopy/Energy Dispersive X-ray), X-ray, Cross-section analysis, etc.